首页 >  Term: scanning electron microscope (SEM)
scanning electron microscope (SEM)

An electron-beam-based microscope used to examine, in a three dimensional screen image, the surface structure of prepared specimens.

0 0

创建者

  • bluemoon
  •  (Gold) 2587 分数
  • 100% positive feedback
© 2024 CSOFT International, Ltd.